cntr -- Unique identification number for the Catalog source. coadd_id -- Atlas Tile identifier from which source was extracted. na -- Active deblending flag. Indicates if a single detection was split into multiple sources in the process of profile-fitting. nb -- Number of PSF components used simultaneously in the profile-fitting for this source. This is greater than "1" when the source is fit concurrently with other nearby detections (passive deblending), or when a single source is split into two components during the fitting process (active deblending). q12 -- Correlation significance between 3.4µm and 4.6µm. q23 -- Correlation significance between 4.6µm and 12µm. q34 -- Correlation significance between 12µm and 22µm. rchi2 -- Combined reduced χ² of the profile-fit photometry measurement in all bands. satnum -- Minimum sample at which saturation occurs in each band. Four character string, one character per band, that indicates the minimum SUTR sample in which any pixel in the profile-fitting area in all of the single-exposure images used to characterize this source was flagged as having reached the saturation level in the on-board WISE payload processing. If no pixels in a given band are flagged as saturated, the value for that band is '0'. sigradec -- The co-sigma of the equatorial position uncertainties, sig_ra, sig_dec (σα, σδ). src -- Sequential number of this source extraction in the Atlas Tile from which this source was extracted, in approximate descending order of W1 source brightness. w1ba -- Axis ratio (b/a) of the elliptical aperture used to measure source in 3.4µm w1flg -- 3.4µm "standard" aperture measurement quality flag. w1frtr -- Fraction of pixels affected by transients. This column gives the fraction of all 3.4µm pixels in the stack of individual 3.4µm exposures used to characterize this source that may be affected by transient events. This number is computed by counting the number of pixels in the single exposure Bit Mask images with value "21" that are present within the profile-fitting area, a circular region with radius of 7.25", centered on the position of this source, and dividing by the total number of pixels in the same area that are available for measurement. w1gerr -- Uncertainty in the 3.4µm magnitude of source measured in elliptical aperture. w1gflg -- W1 elliptical aperture measurement quality flag. This flag indicates if one or more image pixels in the measurement aperture for this band is confused with nearby objects, is contaminated by saturated or otherwise unusable pixels, or is an upper limit. w1gmag -- 3.4µm magnitude of source measured in the elliptical aperture described by w1rsemi, w1w1ba, and w1w1pa. w1mcor -- 3.4µm aperture curve-of-growth correction, in magnitudes. This correction is subtracted from the nominal 8.25" aperture photometry brightness to give the "standard-aperture" magnitude. w1mjdmax -- The latest modified Julian Date (mJD) of the 3.4µm single-exposures covering the source. w1mjdmin -- The earliest modified Julian Date (mJD) of the 3.4µm single-exposures covering the source. w1ndf -- Number of degrees of freedom in the flux variability chi-square, 3.4µm. w1pa -- Position angle (degrees E of N) of the elliptical aperture major axis used to measure source in 3.4µm w1rchi2 -- Reduced χ² of the 3.4µm profile-fit photometry measurement. This column is null if the 3.4µm magnitude is a 95% confidence upper limit (i.e. the source is not detected). w1rsemi -- Semi-major axis of the elliptical aperture used to measure source in 3.4µm w1sat -- Saturated pixel fraction, 3.4µm. The fraction of all pixels within the profile-fitting area in the stack of single-exposure images used to characterize this source that are flagged as saturated. A value larger than 0.0 indicates one or more pixels of saturation. Saturation begins to occur for point sources brighter than [3.4µm]~8 mag. Saturation may occur in fainter sources because of a charged particle strike. w1sigm -- Uncertainty in the 3.4µm "standard" aperture magnitude. This column is null if the 3.4µm "standard" aperture magnitude is an upper limit, or if an aperture measurement was not possible. w1snr -- 3.4µm profile-fit measurement signal-to-noise ratio. This value is the ratio of the flux (w1flux) to flux uncertainty (w1sigflux)in the W1 profile-fit photometry measurement. This column is null if w1flux is negative, or if w1flux or w1sigflux are null. w2ba -- Axis ratio (b/a) of the elliptical aperture used to measure source in 4.6µm w2flg -- 4.6µm "standard" aperture measurement quality flag. w2frtr -- Fraction of pixels affected by transients. This column gives the fraction of all 4.6µm pixels in the stack of individual 4.6µm exposures used to characterize this source that may be affected by transient events. This number is computed by counting the number of pixels in the single exposure Bit Mask images with value "21" that are present within the profile-fitting area, a circular region with radius of 7.25", centered on the position of this source, and dividing by the total number of pixels in the same area that are available for measurement. w2gerr -- Uncertainty in the 4.6µm magnitude of source measured in elliptical aperture. w2gflg -- W1 elliptical aperture measurement quality flag. This flag indicates if one or more image pixels in the measurement aperture for this band is confused with nearby objects, is contaminated by saturated or otherwise unusable pixels, or is an upper limit. w2gmag -- 4.6µm magnitude of source measured in the elliptical aperture described by w2rsemi, w2w1ba, and w2w1pa. w2mcor -- 4.6µm aperture curve-of-growth correction, in magnitudes. This correction is subtracted from the nominal 8.25" aperture photometry brightness to give the "standard-aperture" magnitude. w2mjdmax -- The latest modified Julian Date (mJD) of the 4.6µm single-exposures covering the source. w2mjdmin -- The earliest modified Julian Date (mJD) of the 4.6µm single-exposures covering the source. w2ndf -- Number of degrees of freedom in the flux variability chi-square, 4.6µm. w2pa -- Position angle (degrees E of N) of the elliptical aperture major axis used to measure source in 4.6µm w2rchi2 -- Reduced χ² of the 4.6µm profile-fit photometry measurement. This column is null if the 4.6µm magnitude is a 95% confidence upper limit (i.e. the source is not detected). w2rsemi -- Semi-major axis of the elliptical aperture used to measure source in 4.6µm w2sat -- Saturated pixel fraction, 4.6µm. The fraction of all pixels within the profile-fitting area in the stack of single-exposure images used to characterize this source that are flagged as saturated. A value larger than 0.0 indicates one or more pixels of saturation. Saturation begins to occur for point sources brighter than [4.6µm]~7 mag. Saturation may occur in fainter sources because of a charged particle strike. w2sigm -- Uncertainty in the 4.6µm "standard" aperture magnitude. This column is null if the 4.6µm "standard" aperture magnitude is an upper limit, or if an aperture measurement was not possible. w2snr -- 4.6µm profile-fit measurement signal-to-noise ratio. This value is the ratio of the flux (w2flux) to flux uncertainty (w2sigflux)in the W1 profile-fit photometry measurement. This column is null if w2flux is negative, or if w2flux or w2sigflux are null. w3ba -- Axis ratio (b/a) of the elliptical aperture used to measure source in 12µm w3flg -- 12µm "standard" aperture measurement quality flag. w3frtr -- Fraction of pixels affected by transients. This column gives the fraction of all 12µm pixels in the stack of individual 12µm exposures used to characterize this source that may be affected by transient events. This number is computed by counting the number of pixels in the single exposure Bit Mask images with value "21" that are present within the profile-fitting area, a circular region with radius of 7.25", centered on the position of this source, and dividing by the total number of pixels in the same area that are available for measurement. w3gerr -- Uncertainty in the 12µm magnitude of source measured in elliptical aperture. w3gflg -- W1 elliptical aperture measurement quality flag. This flag indicates if one or more image pixels in the measurement aperture for this band is confused with nearby objects, is contaminated by saturated or otherwise unusable pixels, or is an upper limit. w3gmag -- 12µm magnitude of source measured in the elliptical aperture described by w3rsemi, w3w1ba, and w3w1pa. w3mcor -- 12µm aperture curve-of-growth correction, in magnitudes. This correction is subtracted from the nominal 8.25" aperture photometry brightness to give the "standard-aperture" magnitude. w3mjdmax -- The latest modified Julian Date (mJD) of the 12µm single-exposures covering the source. w3mjdmin -- The earliest modified Julian Date (mJD) of the 12µm single-exposures covering the source. w3ndf -- Number of degrees of freedom in the flux variability chi-square, 12µm. w3pa -- Position angle (degrees E of N) of the elliptical aperture major axis used to measure source in 12µm w3rchi2 -- Reduced χ² of the 12µm profile-fit photometry measurement. This column is null if the 12µm magnitude is a 95% confidence upper limit (i.e. the source is not detected). w3rsemi -- Semi-major axis of the elliptical aperture used to measure source in 12µm w3sat -- Saturated pixel fraction, 12µm. The fraction of all pixels within the profile-fitting area in the stack of single-exposure images used to characterize this source that are flagged as saturated. A value larger than 0.0 indicates one or more pixels of saturation. Saturation begins to occur for point sources brighter than [12µm]~4 mag. Saturation may occur in fainter sources because of a charged particle strike. w3sigm -- Uncertainty in the 12µm "standard" aperture magnitude. This column is null if the 12µm "standard" aperture magnitude is an upper limit, or if an aperture measurement was not possible. w3snr -- 12µm profile-fit measurement signal-to-noise ratio. This value is the ratio of the flux (w3flux) to flux uncertainty (w3sigflux)in the W1 profile-fit photometry measurement. This column is null if w3flux is negative, or if w3flux or w3sigflux are null. w4ba -- Axis ratio (b/a) of the elliptical aperture used to measure source in 22µm w4flg -- 22µm "standard" aperture measurement quality flag. w4frtr -- Fraction of pixels affected by transients. This column gives the fraction of all 22µm pixels in the stack of individual 22µm exposures used to characterize this source that may be affected by transient events. This number is computed by counting the number of pixels in the single exposure Bit Mask images with value "21" that are present within the profile-fitting area, a circular region with radius of 7.25", centered on the position of this source, and dividing by the total number of pixels in the same area that are available for measurement. w4gerr -- Uncertainty in the 22µm magnitude of source measured in elliptical aperture. w4gflg -- W1 elliptical aperture measurement quality flag. This flag indicates if one or more image pixels in the measurement aperture for this band is confused with nearby objects, is contaminated by saturated or otherwise unusable pixels, or is an upper limit. w4gmag -- 22µm magnitude of source measured in the elliptical aperture described by w4rsemi, w4w1ba, and w4w1pa. w4mcor -- 22µm aperture curve-of-growth correction, in magnitudes. This correction is subtracted from the nominal 8.25" aperture photometry brightness to give the "standard-aperture" magnitude. w4mjdmax -- The latest modified Julian Date (mJD) of the 22µm single-exposures covering the source. w4mjdmin -- The earliest modified Julian Date (mJD) of the 22µm single-exposures covering the source. w4ndf -- Number of degrees of freedom in the flux variability chi-square, 22µm. w4pa -- Position angle (degrees E of N) of the elliptical aperture major axis used to measure source in 22µm w4rchi2 -- Reduced χ² of the 22µm profile-fit photometry measurement. This column is null if the 22µm magnitude is a 95% confidence upper limit (i.e. the source is not detected). w4rsemi -- Semi-major axis of the elliptical aperture used to measure source in 22µm w4sat -- Saturated pixel fraction, 22µm. The fraction of all pixels within the profile-fitting area in the stack of single-exposure images used to characterize this source that are flagged as saturated. A value larger than 0.0 indicates one or more pixels of saturation. Saturation begins to occur for point sources brighter than [22µm]~0 mag. Saturation may occur in fainter sources because of a charged particle strike. w4sigm -- Uncertainty in the 22µm "standard" aperture magnitude. This column is null if the 22µm "standard" aperture magnitude is an upper limit, or if an aperture measurement was not possible. w4snr -- 22µm profile-fit measurement signal-to-noise ratio. This value is the ratio of the flux (w4flux) to flux uncertainty (w4sigflux)in the W1 profile-fit photometry measurement. This column is null if w4flux is negative, or if w4flux or w4sigflux are null. wx -- The x-pixel coordinate of this source on the Atlas Image. wy -- The y-pixel coordinate of this source on the Atlas Image.
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