J/A+A/661/A1ivo://CDS.VizieR/J/A+A/661/A1doi:10.26093/cds/vizier.36610001CDSBrunner H.Liu T.Lamer G.Georgakakis A.Merloni A.Brusa M.,Bulbul E.Dennerl K.Friedrich S.Liu A.Maitra C.Nandra K.,Ramos-Ceja M.E.Sanders J.S.Stewart I.M.Boller T.Buchner J.,Clerc N.Comparat J.Dwelly T.Eckert D.Finoguenov A.Freyberg M.,Ghirardini V.Gueguen A.Haberl F.Kreykenbohm I.Krumpe M.,Osterhage S.Pacaud F.Predehl P.Reiprich T.H.Robrade J.Salvato M.,Santangelo A.Schrabback T.Schwope A.Wilms J.2022-09-08T13:25:12Z2022-05-18T12:55:18ZCDS support team

CDS, Observatoire de Strasbourg, 11 rue de l'Universite, F-67000 Strasbourg, France

cds-question@unistra.frsurveysx-ray-sourcesactive-galactic-nucleigalaxy-clustersquasarsx-ray-binary-starsThe eROSITA X-ray telescope onboard the Spectrum-Roentgen-Gamma (SRG) observatory combines a large field of view and a large collecting area in the energy range between ~0.2 and ~8.0 keV with the capability to perform uniform scanning observations of large sky areas. SRG/eROSITA performed scanning observations of the ~140 square degrees eROSITA Final Equatorial Depth Survey field (the eFEDS field) as part of its performance verification phase ahead of the planned four years of all-sky scanning operations. The observing time of eFEDS was chosen to slightly exceed the depth expected in an equatorial field after the completion of the all-sky survey. While verifying the capability of eROSITA to perform large area uniform surveys and serving as a test and training dataset to establish calibration and data analysis procedures, the eFEDS survey also constitutes the largest contiguous soft X-ray survey at this depth to date, supporting a range of early eROSITA survey science investigations. Here we present a catalogue of detected X-ray sources in the eFEDS field providing source positions and extent information, as well as fluxes in multiple energy bands. The data were fed through a standard data processing pipeline, which applies X-ray event calibration and provides a set of standard calibrated data products. A multi-stage source detection procedure, building in part on experience from XMM-Newton, was optimized and calibrated by performing realistic simulations of the eROSITA eFEDS observations. Source fluxes are computed in multiple standard energy bands, both by forced PSF-fitting and aperture photometry. We cross-matched the eROSITA eFEDS source catalogue with previous XMM-ATLAS observations, confirming excellent agreement of the eROSITA and XMM-ATLAS source fluxes. Astrometric corrections were performed by cross-matching the eROSITA source positions with an optical reference catalogue of quasars. We present a primary catalogue of 27910 X-ray sources (including 542 with significant spatial extent) detected in the 0.2-2.3keV energy range with detection likelihoods >6, corresponding to a (point source) flux limit of 6.5*10^-15^erg/cm^2^/s in the 0.5-2.0keV energy band (80% completeness). A supplementary catalogue contains 4774 low-significance source candidates with detection likelihoods between 5 and 6. In addition, a hard band sample of 246 sources detected in the energy range 2.3-5.0keV above a detection likelihood of 10 is provided. Finally, we provide in appendix a description of the dedicated data analysis software package, of the eROSITA calibration database and of the standard calibrated data products.2022A&A...661A...1Bhttps://cdsarc.cds.unistra.fr/viz-bin/cat/J/A+A/661/A1CatalogResearchIsServedByTAP VizieR generic serviceIsServedByConesearch servicerelated-toJ/A+A/661/A2 : Galaxy clusters and groups in eFEDS (Liu+, 2022)J/A+A/661/A3 : eFEDS counterparts to point-like sources (Salvato+, 2022)J/A+A/661/A4 : eFEDS optical cluster and group catalog (Klein+, 2022)J/A+A/661/A5 : The eFEDS AGN catalog (Liu+, 2022)J/A+A/661/A7 : X-ray properties of eFEDS clusters and groups (Bahar+, 2022)J/A+A/661/A8 : eFEDS catalogue of variable X-ray sources (Boller+, 2022)J/A+A/661/A10 : eFEDS galaxy clusters and groups in disguise (Bulbul+, 2022)J/A+A/661/A23 : Exoplanet X-ray irradiation & evaporation rates (Foster+, 2022)J/A+A/661/A24 : Corona-chromosphere connection (Fuhrmeister+, 2022)J/A+A/661/A29 : First eROSITA study of nearby M dwarfs (Magaudda+, 2022)J/A+A/661/A34 : eta Cha cluster eROSITA X-ray scan (Robrade+, 2022)J/A+A/661/A35 : eROSITA study of 47 Tuc globular cluster (Saeedi+, 2022)J/A+A/661/A38 : SRG/ART-XC 1st year all-sky X-ray survey (Pavlinsky+, 2022)J/A+A/661/A40 : eRASS1 X-ray sources Sco-Cen members (Schmitt+, 2022)J/A+A/661/A44 : A first eROSITA view of ultracool dwarfs (Stelzer+, 2022)https://erosita.mpe.mpg.de/edr/eROSITAObservations/Catalogues :liuT/eFEDS_catalog_V3.3.html : eFEDS catalog V3.3https://cds.unistra.fr/vizier-org/licences_vizier.htmlhttps://vizier.cds.unistra.fr/viz-bin/VizieR-2?-source=J/A+A/661/A1https://vizier.iucaa.in/viz-bin/VizieR-2?-source=J/A+A/661/A1http://vizieridia.saao.ac.za/viz-bin/VizieR-2?-source=J/A+A/661/A1https://vizier.cds.unistra.fr/viz-bin/votable?-source=J/A+A/661/A1https://vizier.iucaa.in/viz-bin/votable?-source=J/A+A/661/A1http://vizieridia.saao.ac.za/viz-bin/votable?-source=J/A+A/661/A1GETtext/xml+votablehttps://tapvizier.cds.unistra.fr/TAPVizieR/tapCone search capability for table J/A+A/661/A1/main (eFEDS main X-ray catalog, converted from eFEDS_c001_main_V7.4.fits)https://vizier.cds.unistra.fr/viz-bin/conesearch/J/A+A/661/A1/main?https://vizier.iucaa.in/viz-bin/conesearch/J/A+A/661/A1/main?http://vizieridia.saao.ac.za/viz-bin/conesearch/J/A+A/661/A1/main?GETtext/xml+votable180.050000true144.25389289137351.09596545157040.005555555555555556Cone search capability for table J/A+A/661/A1/supp (eFEDS supplementary catalog, converted from eFEDS_c001_supp_V7.4.fits)https://vizier.cds.unistra.fr/viz-bin/conesearch/J/A+A/661/A1/supp?https://vizier.iucaa.in/viz-bin/conesearch/J/A+A/661/A1/supp?http://vizieridia.saao.ac.za/viz-bin/conesearch/J/A+A/661/A1/supp?GETtext/xml+votable180.050000true143.76166695352154.38485329233850.005555555555555556Cone search capability for table J/A+A/661/A1/hard (eFEDS hard-band selected catalog, converted from eFEDS_c001_hard_V7.5.fits))https://vizier.cds.unistra.fr/viz-bin/conesearch/J/A+A/661/A1/hard?https://vizier.iucaa.in/viz-bin/conesearch/J/A+A/661/A1/hard?http://vizieridia.saao.ac.za/viz-bin/conesearch/J/A+A/661/A1/hard?GETtext/xml+votable180.050000true144.25433662347951.09586992292430.0055555555555555564/256 1365 1367 1706-1707 5/1028-1030 1032-1034 5457 5459 5464-5465 5493 6818-6820 6822-6823 6834 6840-6842 10238-10239 6/4124-4126 4140-4141 4144 4146 4160-4161 4224 4226 21827 21833-21835 21868-21869 21969 27183 27194 27269-27271 27286-27287 27342-27343 27372 27374 40947 40949-40951https://cdsarc.cds.unistra.fr/viz-bin/moc/J/A+A/661/A1?format=asciiX-raydefaultJ/A+A/661/A1/maineFEDS main X-ray catalog, converted from eFEDS_c001_main_V7.4.fitsrecnoRecord number assigned by the VizieR team. Should Not be used for identification.meta.recordintNameSource name, eFEDS JHHMMSS.s+DDMMSS (Name)meta.id;meta.maincharID-SRC[1/32684] Source ID for main and supp catalogs(ID_SRC)meta.idintID-hard? Source ID in the eFEDS hard-band selected catalog (ID_hard)meta.idintnullableRA_ICRS[126.24/145.66] Uncorrected RA (ICRS) (RA)degpos.eq.ra;meta.mainindexedDE_ICRS[-2.95/6.03] Uncorrected Dec (ICRS) (DEC)degpos.eq.dec;meta.mainindexedePos? Combined positional uncertainty, uncorrected (RADEC_ERR)arcsecstat.error;posdoublenullablee_MLRates1 sigma lower error of count rate; 0.5-2keV (ML_RATE_LOWERR_s)ct/sstat.errordoublee_MLRateh1 sigma lower error of count rate; 2.3-5keV (ML_RATE_LOWERR_h)ct/sstat.errordoublee_MLRateu1 sigma lower error of count rate; 5-8keV (ML_RATE_LOWERR_u)ct/sstat.errordoubleE_MLRateb11 sigma upper error of count rate; 0.2-0.5keV (ML_RATE_UPERR_b1)ct/sstat.error;stat.maxdoubleE_MLRateb21 sigma upper error of count rate; 0.5-1keV (ML_RATE_UPERR_b2)ct/sstat.error;stat.maxdoubleE_MLRateb31 sigma upper error of count rate; 1-2keV (ML_RATE_UPERR_b3)ct/sstat.error;stat.maxdoubleE_MLRateb41 sigma upper error of count rate; 2-4.5keV (ML_RATE_UPERR_b4)ct/sstat.error;stat.maxdoubleE_MLRates1 sigma upper error of count rate; 0.5-2keV (ML_RATE_UPERR_s)ct/sstat.error;stat.maxdoubleE_MLRateh1 sigma upper error of count rate; 2.3-5keV (ML_RATE_UPERR_h)ct/sstat.error;stat.maxdoubleE_MLRateu1 sigma upper error of count rate; 5-8keV (ML_RATE_UPERR_u)ct/sstat.error;stat.maxdoubleMLCtsb1Source net counts measured from count rate; 0.2-0.5keV (ML_CTS_b1)ctphot.countdoubleMLCtsb2Source net counts measured from count rate; 0.5-1keV (ML_CTS_b2)ctphot.countdoubleMLCtsb3Source net counts measured from count rate; 1-2keV (ML_CTS_b3)ctphot.countdoubleMLCtsb4Source net counts measured from count rate; 2-4.5keV (ML_CTS_b4)ctphot.countdoubleMLCtssSource net counts measured from count rate; 0.5-2keV (ML_CTS_s)ctphot.countdoubleMLCtshSource net counts measured from count rate; 2.3-5keV (ML_CTS_h)ctphot.countdoubleMLCtsuSource net counts measured from count rate; 5-8keV (ML_CTS_u)ctphot.countdoubles_MLCtsb11 sigma counts error; 0.2-0.5keV (ML_CTS_ERR_b1)ctstat.error;phot.countdoubles_MLCtsb21 sigma counts error; 0.5-1keV (ML_CTS_ERR_b2)ctstat.error;phot.countdoubles_MLCtsb31 sigma counts error; 1-2keV (ML_CTS_ERR_b3)ctstat.error;phot.countdoubles_MLCtsb41 sigma counts error; 2-4.5keV (ML_CTS_ERR_b4)ctstat.error;phot.countdoublee_MLFluxb41 sigma lower error of flux; 2-4.5keV (ML_FLUX_LOWERR_b4)mW.m**-2stat.errordoublee_MLFluxs1 sigma lower error of flux; 0.5-2keV (ML_FLUX_LOWERR_s)mW.m**-2stat.errordoublee_MLFluxh1 sigma lower error of flux; 2.3-5keV (ML_FLUX_LOWERR_h)mW.m**-2stat.errordoublee_MLFluxu1 sigma lower error of flux; 5-8keV (ML_FLUX_LOWERR_u)mW.m**-2stat.errordoubleE_MLFluxb1[0.0/0.01] 1 sigma upper error of flux; 0.2-0.5keV (ML_FLUX_UPERR_b1)mW.m**-2stat.error;stat.maxdoubleE_MLFluxb2[0.0/0.01] 1 sigma upper error of flux; 0.5-1keV (ML_FLUX_UPERR_b2)mW.m**-2stat.error;stat.maxdoubleE_MLFluxb3[0.0/0.01] 1 sigma upper error of flux; 1-2keV (ML_FLUX_UPERR_b3)mW.m**-2stat.error;stat.maxdoubleE_MLFluxb4[0.0/0.01] 1 sigma upper error of flux; 2-4.5keV (ML_FLUX_UPERR_b4)mW.m**-2stat.error;stat.maxdoubleE_MLFluxs[0.0/0.01] 1 sigma upper error of flux; 0.5-2keV (ML_FLUX_UPERR_s)mW.m**-2stat.error;stat.maxdoubleE_MLFluxh[0.0/0.01] 1 sigma upper error of flux; 2.3-5keV (ML_FLUX_UPERR_h)mW.m**-2stat.error;stat.maxdoubleE_MLFluxu[0.0/0.01] 1 sigma upper error of flux; 5-8keV (ML_FLUX_UPERR_u)mW.m**-2stat.error;stat.maxdoubleMLExpb1Vignetted exposure value; 0.2-0.5keV (ML_EXP_b1)sstat.value;obs.exposurefloatMLExpb2Vignetted exposure value; 0.5-1keV (ML_EXP_b2)sstat.value;obs.exposurefloatMLExpb3Vignetted exposure value; 1-2keV (ML_EXP_b3)sstat.value;obs.exposurefloatMLExpb4Vignetted exposure value; 2-4.5keV (ML_EXP_b4)sstat.value;obs.exposurefloatMLExps[36.49/3314.72] Vignetted exposure value; 0.5-2keV (ML_EXP_s)sstat.value;obs.exposurefloatMLExphVignetted exposure value; 2.3-5keV (ML_EXP_h)sstat.value;obs.exposurefloatMLExpuVignetted exposure value; 5-8keV (ML_EXP_u)sstat.value;obs.exposurefloatMLBkghBackground at the source position; 2.3-5keV (ML_BKG_h)count.arcmin**-2instr.backgrounddoubleMLBkguBackground at the source position; 5-8keV (ML_BKG_u)count.arcmin**-2instr.backgrounddoubleApCtsb1Total counts extracted within the aperture; 0.2-0.5keV (APE_CTS_b1)ctphot.count;em.X-rayintApCtsb2Total counts extracted within the aperture; 0.5-1keV (APE_CTS_b2)ctphot.count;em.X-rayintApCtsb3Total counts extracted within the aperture; 1-2keV (APE_CTS_b3)ctphot.count;em.X-rayintApCtsb4Total counts extracted within the aperture; 2-4.5keV (APE_CTS_b4)ctphot.count;em.X-rayintApCtssTotal counts extracted within the aperture; 0.5-2keV (APE_CTS_s)ctphot.count;em.X-rayintApCtshTotal counts extracted within the aperture; 2.3-5keV (APE_CTS_h)ctphot.count;em.X-rayintApCtsuTotal counts extracted within the aperture; 5-8keV (APE_CTS_u)ctphot.count;em.X-rayintApExpb1[31.31/3393.24] Vignetted exposure value; 0.2-0.5keV (APE_EXP_b1)sstat.value;obs.exposurefloatApExpb2[28.12/3353.79] Vignetted exposure value; 0.5-1keV (APE_EXP_b2)sstat.value;obs.exposurefloatApExpb3[29.29/3304.8] Vignetted exposure value; 1-2keV (APE_EXP_b3)sstat.value;obs.exposurefloatApExpb4[22.35/2952.79] Vignetted exposure value; 2-4.5keV (APE_EXP_b4)sstat.value;obs.exposurefloatApRadb3[0.46/10.1] Aperture radius; 1-2keV (APE_RADIUS_b3)pixstat.fit.paramdoubleApRadb4[0.54/14.86] Aperture radius; 2-4.5keV (APE_RADIUS_b4)pixstat.fit.paramdoubleApRads[0.45/9.87] Aperture radius; 0.5-2keV (APE_RADIUS_s)pixstat.fit.paramdoubleRAcdeg[126.24/145.66] Corrected RA (ICRS) (RA_CORR)degpos.eq.raDEcdeg[-2.95/6.03] Corrected Dec (ICRS) (DEC_CORR)degpos.eq.decePoscCombined positional uncertainty, corrected (RADEC_ERR_CORR)arcsecstat.error;posdoubleExtSource extent (EXT)arcsecphys.angSizedoublee_Ext? Extent error (EXT_ERR)arcsecstat.errordoublenullableExtLikeExtent likelihood (EXT_LIKE)stat.likelihooddoubleDetLikeDetection likelihood measured by PSF-fitting (DET_LIKE)stat.likelihooddoubleMLRateSource count rate measured by PSF-fitting (ML_RATE)ct/sphot.count;em.X-raydoublee_MLRate? 1 sigma count rate error (ML_RATE_ERR)ct/sstat.errordoublenullableMLCtsSource net counts measured from count rate (ML_CTS)ctphot.countdoublee_MLCts? 1 sigma counts error (ML_CTS_ERR)ctstat.errordoublenullableMLFluxSource flux converted from count rate (ML_FLUX)mW.m**-2phot.flux;em.X-raydoublee_MLFlux? 1 sigma flux error (ML_FLUX_ERR)mW.m**-2stat.errordoublenullableMLExpVignetted exposure value (ML_EXP)sstat.value;obs.exposuredoubleMLBkgBackground at the source position (ML_BKG)count.arcmin**-2instr.backgrounddoubleinArea90Whether in the 0.2-2.3keV exp>500s region, which comprises 90% area (inArea90)meta.codeintDetLikeb1Detection likelihood measured by forced PSF-fitting; 0.2-0.5keV (DET_LIKE_b1)stat.likelihooddoubleDetLikeb2Detection likelihood measured by forced PSF- fitting; 0.5-1keV (DET_LIKE_b2)stat.likelihooddoubleDetLikeb3Detection likelihood measured by forced PSF-fitting; 1-2keV (DET_LIKE_b3)stat.likelihooddoubleDetLikeb4Detection likelihood measured by forced PSF-fitting; 2-4.5keV (DET_LIKE_b4)stat.likelihooddoubleDetLikesDetection likelihood measured by forced PSF-fitting; 0.5-2keV (DET_LIKE_s)stat.likelihooddoubleDetLikehDetection likelihood measured by forced PSF-fitting; 2.3-5keV (DET_LIKE_h)stat.likelihooddoubleDetLikeuDetection likelihood measured by forced PSF-fitting; 5-8keV (DET_LIKE_u)stat.likelihooddoubleMLRateb1Source count rate measured by forced PSF-fitting; .2-.5keV (ML_RATE_b1)ct/sphot.count;em.X-raydoubleMLRateb2Source count rate measured by forced PSF-fitting; 0.5-1keV (ML_RATE_b2)ct/sphot.count;em.X-raydoubleMLRateb3Source count rate measured by forced PSF-fitting; 1-2keV (ML_RATE_b3)ct/sphot.count;em.X-raydoubleMLRateb4Source count rate measured by forced PSF-fitting; 2-4.5keV (ML_RATE_b4)ct/sphot.count;em.X-raydoubleMLRatesSource count rate measured by forced PSF-fitting; 0.5-2keV (ML_RATE_s)ct/sphot.count;em.X-raydoubleMLRatehSource count rate measured by forced PSF-fitting; 2.3-5keV (ML_RATE_h)ct/sphot.count;em.X-raydoubleMLRateuSource count rate measured by forced PSF-fitting; 5-8keV (ML_RATE_u)ct/sphot.count;em.X-raydoubles_MLRateb11 sigma count rate error; 0.2-0.5keV (ML_RATE_ERR_b1)ct/sarith.rate;phot.countdoubles_MLRateb21 sigma count rate error; 0.5-1keV (ML_RATE_ERR_b2)ct/sarith.rate;phot.countdoubles_MLRateb31 sigma count rate error; 1-2keV (ML_RATE_ERR_b3)ct/sarith.rate;phot.countdoubles_MLRateb41 sigma count rate error; 2-4.5keV (ML_RATE_ERR_b4)ct/sarith.rate;phot.countdoubles_MLRates1 sigma count rate error; 0.5-2keV (ML_RATE_ERR_s)ct/sarith.rate;phot.countdoubles_MLRateh1 sigma count rate error; 2.3-5keV (ML_RATE_ERR_h)ct/sarith.rate;phot.countdoubles_MLRateu1 sigma count rate error; 5-8keV (ML_RATE_ERR_u)ct/sarith.rate;phot.countdoublee_MLRateb11 sigma lower error of count rate; 0.2-0.5keV (ML_RATE_LOWERR_b1)ct/sstat.errordoublee_MLRateb21 sigma lower error of count rate; 0.5-1keV (ML_RATE_LOWERR_b2)ct/sstat.errordoublee_MLRateb31 sigma lower error of count rate; 1-2keV (ML_RATE_LOWERR_b3)ct/sstat.errordoublee_MLRateb41 sigma lower error of count rate; 2-4.5keV (ML_RATE_LOWERR_b4)ct/sstat.errordoubles_MLCtss1 sigma counts error; 0.5-2keV (ML_CTS_ERR_s)ctstat.error;phot.countdoubles_MLCtsh1 sigma counts error; 2.3-5keV (ML_CTS_ERR_h)ctstat.error;phot.countdoubles_MLCtsu1 sigma counts error; 5-8keV (ML_CTS_ERR_u)ctstat.error;phot.countdoublee_MLCtsb11 sigma lower error of counts;0.2-0.5keV (ML_CTS_LOWERR_b1)ctstat.errordoublee_MLCtsb21 sigma lower error of counts;0.5-1keV (ML_CTS_LOWERR_b2)ctstat.errordoublee_MLCtsb31 sigma lower error of counts;1-2keV (ML_CTS_LOWERR_b3)ctstat.errordoublee_MLCtsb41 sigma lower error of counts;2-4.5keV (ML_CTS_LOWERR_b4)ctstat.errordoublee_MLCtss1 sigma lower error of counts;0.5-2keV (ML_CTS_LOWERR_s)ctstat.errordoublee_MLCtsh1 sigma lower error of counts;2.3-5keV (ML_CTS_LOWERR_h)ctstat.errordoublee_MLCtsu1 sigma lower error of counts;5-8keV (ML_CTS_LOWERR_u)ctstat.errordoubleE_MLCtsb11 sigma upper error of counts;0.2-0.5keV (ML_CTS_UPERR_b1)ctstat.error;stat.maxdoubleE_MLCtsb21 sigma upper error of counts;0.5-1keV (ML_CTS_UPERR_b2)ctstat.error;stat.maxdoubleE_MLCtsb31 sigma upper error of counts;1-2keV (ML_CTS_UPERR_b3)ctstat.error;stat.maxdoubleE_MLCtsb41 sigma upper error of counts;2-4.5keV (ML_CTS_UPERR_b4)ctstat.error;stat.maxdoubleE_MLCtss1 sigma upper error of counts;0.5-2keV (ML_CTS_UPERR_s)ctstat.error;stat.maxdoubleE_MLCtsh1 sigma upper error of counts;2.3-5keV (ML_CTS_UPERR_h)ctstat.error;stat.maxdoubleE_MLCtsu1 sigma upper error of counts;5-8keV (ML_CTS_UPERR_u)ctstat.error;stat.maxdoubleMLFluxb1Source flux converted from count rate; 0.2-0.5keV (ML_FLUX_b1)mW.m**-2phot.flux;em.X-raydoubleMLFluxb2Source flux converted from count rate; 0.5-1keV (ML_FLUX_b2)mW.m**-2phot.flux;em.X-raydoubleMLFluxb3Source flux converted from count rate; 1-2keV (ML_FLUX_b3)mW.m**-2phot.flux;em.X-raydoubleMLFluxb4Source flux converted from count rate; 2-4.5keV (ML_FLUX_b4)mW.m**-2phot.flux;em.X-raydoubleMLFluxsSource flux converted from count rate; 0.5-2keV (ML_FLUX_s)mW.m**-2phot.flux;em.X-raydoubleMLFluxhSource flux converted from count rate; 2.3-5keV (ML_FLUX_h)mW.m**-2phot.flux;em.X-raydoubleMLFluxuSource flux converted from count rate; 5-8keV (ML_FLUX_u)mW.m**-2phot.flux;em.X-raydoubles_MLFluxb1[0.0/0.01] 1 sigma flux error; 0.2-0.5keV (ML_FLUX_ERR_b1)mW.m**-2stat.error;phot.fluxdoubles_MLFluxb2[0.0/0.01] 1 sigma flux error; 0.5-1keV (ML_FLUX_ERR_b2)mW.m**-2stat.error;phot.fluxdoubles_MLFluxb3[0.0/0.01] 1 sigma flux error; 1-2keV (ML_FLUX_ERR_b3)mW.m**-2stat.error;phot.fluxdoubles_MLFluxb4[0.0/0.01] 1 sigma flux error; 2-4.5keV (ML_FLUX_ERR_b4)mW.m**-2stat.error;phot.fluxdoubles_MLFluxs[0.0/0.01] 1 sigma flux error; 0.5-2keV (ML_FLUX_ERR_s)mW.m**-2stat.error;phot.fluxdoubles_MLFluxh[0.0/0.01] 1 sigma flux error; 2.3-5keV (ML_FLUX_ERR_h)mW.m**-2stat.error;phot.fluxdoubles_MLFluxu[0.0/0.01] 1 sigma flux error; 5-8keV (ML_FLUX_ERR_u)mW.m**-2stat.error;phot.fluxdoublee_MLFluxb11 sigma lower error of flux; 0.2-0.5keV (ML_FLUX_LOWERR_b1)mW.m**-2stat.errordoublee_MLFluxb21 sigma lower error of flux; 0.5-1keV (ML_FLUX_LOWERR_b2)mW.m**-2stat.errordoublee_MLFluxb31 sigma lower error of flux; 1-2keV (ML_FLUX_LOWERR_b3)mW.m**-2stat.errordoubleMLBkgb1Background at the source position; 0.2-0.5keV (ML_BKG_b1)count.arcmin**-2instr.backgrounddoubleMLBkgb2Background at the source position; 0.5-1keV (ML_BKG_b2)count.arcmin**-2instr.backgrounddoubleMLBkgb3Background at the source position; 1-2keV (ML_BKG_b3)count.arcmin**-2instr.backgrounddoubleMLBkgb4Background at the source position; 2-4.5keV (ML_BKG_b4)count.arcmin**-2instr.backgrounddoubleMLBkgsBackground at the source position; 0.5-2keV (ML_BKG_s)count.arcmin**-2instr.backgrounddoubleApExps[26.97/3314.72] Vignetted exposure value; 0.5-2keV (APE_EXP_s)sstat.value;obs.exposurefloatApExph[20.81/2873.35] Vignetted exposure value; 2.3-5keV (APE_EXP_h)sstat.value;obs.exposurefloatApExpu[13.71/2497.99] Vignetted exposure value; 5-8keV (APE_EXP_u)sstat.value;obs.exposurefloatApBkgb1[0.0/2.67] Background counts in the aperture excluding nearby sources; 0.2-.5keV (APE_BKG_b1)ctinstr.backgrounddoubleApBkgb2[0.0/2.72] Background counts in the aperture excluding nearby sources; 0.5-1keV (APE_BKG_b2)ctinstr.backgrounddoubleApBkgb3[0.0/2.47] Background counts in the aperture excluding nearby sources; 1-2keV (APE_BKG_b3)ctinstr.backgrounddoubleApBkgb4[0.0/5.97] Background counts in the aperture excluding nearby sources; 2-4.5keV (APE_BKG_b4)ctinstr.backgrounddoubleApBkgs[0.0/4.95] Background counts in the aperture excluding nearby sources; 0.5-2keV (APE_BKG_s)ctinstr.backgrounddoubleApBkgh[0.0/5.94] Background counts in the aperture excluding nearby sources; 2.3-5keV (APE_BKG_h)ctinstr.backgrounddoubleApBkgu[0.0/14.86] Background counts in the aperture excluding nearby sources; 5-8keV (APE_BKG_u)ctinstr.backgrounddoubleApRadb1[0.41/9.15] Aperture radius; 0.2-0.5keV (APE_RADIUS_b1)pixstat.fit.paramdoubleApRadb2[0.43/9.45] Aperture radius; 0.5-1keV (APE_RADIUS_b2)pixstat.fit.paramdoubleApRadh[0.56/15.48] Aperture radius; 2.3-5keV (APE_RADIUS_h)pixstat.fit.paramdoubleApRadu[0.71/27.23] Aperture radius; 5-8keV (APE_RADIUS_u)pixstat.fit.paramdoubleApPoisb1? [0/0.93] Poisson probability of being background fluctuation; 0.2-0.5keV (APE_POIS_b1)pixstat.fit.goodnessdoublenullableApPoisb2? [0/0.84] Poisson probability of being background fluctuation; 0.5-1keV (APE_POIS_b2)pixstat.fit.goodnessdoublenullableApPoisb3? [0/0.83] Poisson probability of being background fluctuation; 1-2keV (APE_POIS_b3)pixstat.fit.goodnessdoublenullableApPoisb4? [0/1.0] Poisson probability of being background fluctuation; 2-4.5keV (APE_POIS_b4)pixstat.fit.goodnessdoublenullableApPoiss? [0/0.94] Poisson probability of being background fluctuation; 0.5-2keV (APE_POIS_s)pixstat.fit.goodnessdoublenullableApPoish? [0/1.0] Poisson probability of being background fluctuation; 2.3-5keV (APE_POIS_h)pixstat.fit.goodnessdoublenullableApPoisu? [0/1.0] Poisson probability of being background fluctuation; 5-8keV (APE_POIS_u)pixstat.fit.goodnessdoublenullableJ/A+A/661/A1/suppeFEDS supplementary catalog, converted from eFEDS_c001_supp_V7.4.fitsDetLikeb2Detection likelihood measured by forced PSF- fitting; 0.5-1keV (DET_LIKE_b2)stat.likelihooddoubleDetLikeb3Detection likelihood measured by forced PSF-fitting; 1-2keV (DET_LIKE_b3)stat.likelihooddoubleDetLikeb4Detection likelihood measured by forced PSF-fitting; 2-4.5keV (DET_LIKE_b4)stat.likelihooddoubleDetLikesDetection likelihood measured by forced PSF-fitting; 0.5-2keV (DET_LIKE_s)stat.likelihooddoubleDetLikehDetection likelihood measured by forced PSF-fitting; 2.3-5keV (DET_LIKE_h)stat.likelihooddoubleDetLikeuDetection likelihood measured by forced PSF-fitting; 5-8keV (DET_LIKE_u)stat.likelihooddoubleMLRateb1Source count rate measured by forced PSF-fitting; .2-.5keV (ML_RATE_b1)ct/sphot.count;em.X-raydoubleMLRateb2Source count rate measured by forced PSF-fitting; 0.5-1keV (ML_RATE_b2)ct/sphot.count;em.X-raydoubleMLRateb3Source count rate measured by forced PSF-fitting; 1-2keV (ML_RATE_b3)ct/sphot.count;em.X-raydoubleMLRateb4Source count rate measured by forced PSF-fitting; 2-4.5keV (ML_RATE_b4)ct/sphot.count;em.X-raydoubleMLRatesSource count rate measured by forced PSF-fitting; 0.5-2keV (ML_RATE_s)ct/sphot.count;em.X-raydoubleMLRatehSource count rate measured by forced PSF-fitting; 2.3-5keV (ML_RATE_h)ct/sphot.count;em.X-raydoubleMLRateuSource count rate measured by forced PSF-fitting; 5-8keV (ML_RATE_u)ct/sphot.count;em.X-raydoubles_MLRateb11 sigma count rate error; 0.2-0.5keV (ML_RATE_ERR_b1)ct/sarith.rate;phot.countdoubles_MLRateb21 sigma count rate error; 0.5-1keV (ML_RATE_ERR_b2)ct/sarith.rate;phot.countdoubles_MLRateb31 sigma count rate error; 1-2keV (ML_RATE_ERR_b3)ct/sarith.rate;phot.countdoubles_MLRateb41 sigma count rate error; 2-4.5keV (ML_RATE_ERR_b4)ct/sarith.rate;phot.countdoubleE_MLRateh1 sigma upper error of count rate; 2.3-5keV (ML_RATE_UPERR_h)ct/sstat.error;stat.maxdoubleE_MLRateu1 sigma upper error of count rate; 5-8keV (ML_RATE_UPERR_u)ct/sstat.error;stat.maxdoubleMLCtsb1Source net counts measured from count rate; 0.2-0.5keV (ML_CTS_b1)ctphot.countdoubleMLFluxhSource flux converted from count rate; 2.3-5keV (ML_FLUX_h)mW.m**-2phot.flux;em.X-raydoubleMLFluxuSource flux converted from count rate; 5-8keV (ML_FLUX_u)mW.m**-2phot.flux;em.X-raydoubles_MLFluxb1[0.0/0.01] 1 sigma flux error; 0.2-0.5keV (ML_FLUX_ERR_b1)mW.m**-2stat.error;phot.fluxdoubles_MLFluxb2[0.0/0.01] 1 sigma flux error; 0.5-1keV (ML_FLUX_ERR_b2)mW.m**-2stat.error;phot.fluxdoubles_MLFluxb3[0.0/0.01] 1 sigma flux error; 1-2keV (ML_FLUX_ERR_b3)mW.m**-2stat.error;phot.fluxdoubles_MLFluxb4[0.0/0.01] 1 sigma flux error; 2-4.5keV (ML_FLUX_ERR_b4)mW.m**-2stat.error;phot.fluxdoubles_MLFluxs[0.0/0.01] 1 sigma flux error; 0.5-2keV (ML_FLUX_ERR_s)mW.m**-2stat.error;phot.fluxdoubles_MLFluxh[0.0/0.01] 1 sigma flux error; 2.3-5keV (ML_FLUX_ERR_h)mW.m**-2stat.error;phot.fluxdoubles_MLFluxu[0.0/0.01] 1 sigma flux error; 5-8keV (ML_FLUX_ERR_u)mW.m**-2stat.error;phot.fluxdoublee_MLFluxb11 sigma lower error of flux; 0.2-0.5keV (ML_FLUX_LOWERR_b1)mW.m**-2stat.errordoublee_MLFluxb21 sigma lower error of flux; 0.5-1keV (ML_FLUX_LOWERR_b2)mW.m**-2stat.errordoublee_MLFluxb31 sigma lower error of flux; 1-2keV (ML_FLUX_LOWERR_b3)mW.m**-2stat.errordoublee_MLFluxb41 sigma lower error of flux; 2-4.5keV (ML_FLUX_LOWERR_b4)mW.m**-2stat.errordoublee_MLFluxs1 sigma lower error of flux; 0.5-2keV (ML_FLUX_LOWERR_s)mW.m**-2stat.errordoublee_MLFluxh1 sigma lower error of flux; 2.3-5keV (ML_FLUX_LOWERR_h)mW.m**-2stat.errordoublee_MLFluxu1 sigma lower error of flux; 5-8keV (ML_FLUX_LOWERR_u)mW.m**-2stat.errordoubleE_MLFluxb1[0.0/0.01] 1 sigma upper error of flux; 0.2-0.5keV (ML_FLUX_UPERR_b1)mW.m**-2stat.error;stat.maxdoubleE_MLFluxb2[0.0/0.01] 1 sigma upper error of flux; 0.5-1keV (ML_FLUX_UPERR_b2)mW.m**-2stat.error;stat.maxdoubleE_MLFluxb3[0.0/0.01] 1 sigma upper error of flux; 1-2keV (ML_FLUX_UPERR_b3)mW.m**-2stat.error;stat.maxdoubleE_MLFluxh[0.0/0.01] 1 sigma upper error of flux; 2.3-5keV (ML_FLUX_UPERR_h)mW.m**-2stat.error;stat.maxdoubleE_MLFluxu[0.0/0.01] 1 sigma upper error of flux; 5-8keV (ML_FLUX_UPERR_u)mW.m**-2stat.error;stat.maxdoubleMLExpb1Vignetted exposure value; 0.2-0.5keV (ML_EXP_b1)sstat.value;obs.exposurefloatMLExpb2Vignetted exposure value; 0.5-1keV (ML_EXP_b2)sstat.value;obs.exposurefloatMLExpb3Vignetted exposure value; 1-2keV (ML_EXP_b3)sstat.value;obs.exposurefloatMLExpb4Vignetted exposure value; 2-4.5keV (ML_EXP_b4)sstat.value;obs.exposurefloatMLExps[36.49/3314.72] Vignetted exposure value; 0.5-2keV (ML_EXP_s)sstat.value;obs.exposurefloatMLExphVignetted exposure value; 2.3-5keV (ML_EXP_h)sstat.value;obs.exposurefloatMLExpuVignetted exposure value; 5-8keV (ML_EXP_u)sstat.value;obs.exposurefloatMLBkgb1Background at the source position; 0.2-0.5keV (ML_BKG_b1)count.arcmin**-2instr.backgrounddoubleMLBkgb2Background at the source position; 0.5-1keV (ML_BKG_b2)count.arcmin**-2instr.backgrounddoubleMLBkgb3Background at the source position; 1-2keV (ML_BKG_b3)count.arcmin**-2instr.backgrounddoubleMLBkgb4Background at the source position; 2-4.5keV (ML_BKG_b4)count.arcmin**-2instr.backgrounddoubleMLBkgsBackground at the source position; 0.5-2keV (ML_BKG_s)count.arcmin**-2instr.backgrounddoubleMLBkghBackground at the source position; 2.3-5keV (ML_BKG_h)count.arcmin**-2instr.backgrounddoubleMLBkguBackground at the source position; 5-8keV (ML_BKG_u)count.arcmin**-2instr.backgrounddoubleApCtsb1Total counts extracted within the aperture; 0.2-0.5keV (APE_CTS_b1)ctphot.count;em.X-rayintApCtsb2Total counts extracted within the aperture; 0.5-1keV (APE_CTS_b2)ctphot.count;em.X-rayintApCtsb3Total counts extracted within the aperture; 1-2keV (APE_CTS_b3)ctphot.count;em.X-rayintApCtsb4Total counts extracted within the aperture; 2-4.5keV (APE_CTS_b4)ctphot.count;em.X-rayintApCtssTotal counts extracted within the aperture; 0.5-2keV (APE_CTS_s)ctphot.count;em.X-rayintApBkgb1[0.0/2.67] Background counts in the aperture excluding nearby sources; 0.2-.5keV (APE_BKG_b1)ctinstr.backgrounddoubleApBkgb2[0.0/2.72] Background counts in the aperture excluding nearby sources; 0.5-1keV (APE_BKG_b2)ctinstr.backgrounddoublerecnoRecord number assigned by the VizieR team. Should Not be used for identification.meta.recordintNameSource name, eFEDS JHHMMSS.s+DDMMSS (Name)meta.id;meta.maincharID-SRC[1/32684] Source ID for main and supp catalogs(ID_SRC)meta.idintID-hard? Source ID in the eFEDS hard-band selected catalog (ID_hard)meta.idintnullableRA_ICRS[126.24/145.66] Uncorrected RA (ICRS) (RA)degpos.eq.ra;meta.mainDE_ICRS[-2.95/6.03] Uncorrected Dec (ICRS) (DEC)degpos.eq.dec;meta.mainePos? Combined positional uncertainty, uncorrected (RADEC_ERR)arcsecstat.error;posdoublenullableRAcdeg[126.24/145.66] Corrected RA (ICRS) (RA_CORR)degpos.eq.raDEcdeg[-2.95/6.03] Corrected Dec (ICRS) (DEC_CORR)degpos.eq.decePoscCombined positional uncertainty, corrected (RADEC_ERR_CORR)arcsecstat.error;posdoubleExtSource extent (EXT)arcsecphys.angSizedoublee_Ext? Extent error (EXT_ERR)arcsecstat.errordoublenullableExtLikeExtent likelihood (EXT_LIKE)stat.likelihooddoubleDetLikeDetection likelihood measured by PSF-fitting (DET_LIKE)stat.likelihooddoubleMLRateSource count rate measured by PSF-fitting (ML_RATE)ct/sphot.count;em.X-raydoublee_MLRate? 1 sigma count rate error (ML_RATE_ERR)ct/sstat.errordoublenullableMLCtsSource net counts measured from count rate (ML_CTS)ctphot.countdoublee_MLCts? 1 sigma counts error (ML_CTS_ERR)ctstat.errordoublenullableMLFluxSource flux converted from count rate (ML_FLUX)mW.m**-2phot.flux;em.X-raydoublee_MLFlux? 1 sigma flux error (ML_FLUX_ERR)mW.m**-2stat.errordoublenullableMLExpVignetted exposure value (ML_EXP)sstat.value;obs.exposuredoubleMLBkgBackground at the source position (ML_BKG)count.arcmin**-2instr.backgrounddoubleinArea90Whether in the 0.2-2.3keV exp>500s region, which comprises 90% area (inArea90)meta.codeintDetLikeb1Detection likelihood measured by forced PSF-fitting; 0.2-0.5keV (DET_LIKE_b1)stat.likelihooddoubles_MLRates1 sigma count rate error; 0.5-2keV (ML_RATE_ERR_s)ct/sarith.rate;phot.countdoubles_MLRateh1 sigma count rate error; 2.3-5keV (ML_RATE_ERR_h)ct/sarith.rate;phot.countdoubles_MLRateu1 sigma count rate error; 5-8keV (ML_RATE_ERR_u)ct/sarith.rate;phot.countdoublee_MLRateb11 sigma lower error of count rate; 0.2-0.5keV (ML_RATE_LOWERR_b1)ct/sstat.errordoublee_MLRateb21 sigma lower error of count rate; 0.5-1keV (ML_RATE_LOWERR_b2)ct/sstat.errordoublee_MLRateb31 sigma lower error of count rate; 1-2keV (ML_RATE_LOWERR_b3)ct/sstat.errordoublee_MLRateb41 sigma lower error of count rate; 2-4.5keV (ML_RATE_LOWERR_b4)ct/sstat.errordoublee_MLRates1 sigma lower error of count rate; 0.5-2keV (ML_RATE_LOWERR_s)ct/sstat.errordoublee_MLRateh1 sigma lower error of count rate; 2.3-5keV (ML_RATE_LOWERR_h)ct/sstat.errordoublee_MLRateu1 sigma lower error of count rate; 5-8keV (ML_RATE_LOWERR_u)ct/sstat.errordoubleE_MLRateb11 sigma upper error of count rate; 0.2-0.5keV (ML_RATE_UPERR_b1)ct/sstat.error;stat.maxdoubleE_MLRateb21 sigma upper error of count rate; 0.5-1keV (ML_RATE_UPERR_b2)ct/sstat.error;stat.maxdoubleE_MLRateb31 sigma upper error of count rate; 1-2keV (ML_RATE_UPERR_b3)ct/sstat.error;stat.maxdoubleE_MLRateb41 sigma upper error of count rate; 2-4.5keV (ML_RATE_UPERR_b4)ct/sstat.error;stat.maxdoubleE_MLRates1 sigma upper error of count rate; 0.5-2keV (ML_RATE_UPERR_s)ct/sstat.error;stat.maxdoubleMLCtsb2Source net counts measured from count rate; 0.5-1keV (ML_CTS_b2)ctphot.countdoubleMLCtsb3Source net counts measured from count rate; 1-2keV (ML_CTS_b3)ctphot.countdoubleMLCtsb4Source net counts measured from count rate; 2-4.5keV (ML_CTS_b4)ctphot.countdoubleMLCtssSource net counts measured from count rate; 0.5-2keV (ML_CTS_s)ctphot.countdoubleMLCtshSource net counts measured from count rate; 2.3-5keV (ML_CTS_h)ctphot.countdoubleMLCtsuSource net counts measured from count rate; 5-8keV (ML_CTS_u)ctphot.countdoubles_MLCtsb11 sigma counts error; 0.2-0.5keV (ML_CTS_ERR_b1)ctstat.error;phot.countdoubles_MLCtsb21 sigma counts error; 0.5-1keV (ML_CTS_ERR_b2)ctstat.error;phot.countdoubles_MLCtsb31 sigma counts error; 1-2keV (ML_CTS_ERR_b3)ctstat.error;phot.countdoubles_MLCtsb41 sigma counts error; 2-4.5keV (ML_CTS_ERR_b4)ctstat.error;phot.countdoubles_MLCtss1 sigma counts error; 0.5-2keV (ML_CTS_ERR_s)ctstat.error;phot.countdoubles_MLCtsh1 sigma counts error; 2.3-5keV (ML_CTS_ERR_h)ctstat.error;phot.countdoubles_MLCtsu1 sigma counts error; 5-8keV (ML_CTS_ERR_u)ctstat.error;phot.countdoublee_MLCtsb11 sigma lower error of counts;0.2-0.5keV (ML_CTS_LOWERR_b1)ctstat.errordoublee_MLCtsb21 sigma lower error of counts;0.5-1keV (ML_CTS_LOWERR_b2)ctstat.errordoublee_MLCtsb31 sigma lower error of counts;1-2keV (ML_CTS_LOWERR_b3)ctstat.errordoublee_MLCtsb41 sigma lower error of counts;2-4.5keV (ML_CTS_LOWERR_b4)ctstat.errordoublee_MLCtss1 sigma lower error of counts;0.5-2keV (ML_CTS_LOWERR_s)ctstat.errordoublee_MLCtsh1 sigma lower error of counts;2.3-5keV (ML_CTS_LOWERR_h)ctstat.errordoublee_MLCtsu1 sigma lower error of counts;5-8keV (ML_CTS_LOWERR_u)ctstat.errordoubleE_MLCtsb11 sigma upper error of counts;0.2-0.5keV (ML_CTS_UPERR_b1)ctstat.error;stat.maxdoubleE_MLCtsb21 sigma upper error of counts;0.5-1keV (ML_CTS_UPERR_b2)ctstat.error;stat.maxdoubleE_MLCtsb31 sigma upper error of counts;1-2keV (ML_CTS_UPERR_b3)ctstat.error;stat.maxdoubleE_MLCtsb41 sigma upper error of counts;2-4.5keV (ML_CTS_UPERR_b4)ctstat.error;stat.maxdoubleE_MLCtss1 sigma upper error of counts;0.5-2keV (ML_CTS_UPERR_s)ctstat.error;stat.maxdoubleE_MLCtsh1 sigma upper error of counts;2.3-5keV (ML_CTS_UPERR_h)ctstat.error;stat.maxdoubleE_MLCtsu1 sigma upper error of counts;5-8keV (ML_CTS_UPERR_u)ctstat.error;stat.maxdoubleMLFluxb1Source flux converted from count rate; 0.2-0.5keV (ML_FLUX_b1)mW.m**-2phot.flux;em.X-raydoubleMLFluxb2Source flux converted from count rate; 0.5-1keV (ML_FLUX_b2)mW.m**-2phot.flux;em.X-raydoubleMLFluxb3Source flux converted from count rate; 1-2keV (ML_FLUX_b3)mW.m**-2phot.flux;em.X-raydoubleMLFluxb4Source flux converted from count rate; 2-4.5keV (ML_FLUX_b4)mW.m**-2phot.flux;em.X-raydoubleMLFluxsSource flux converted from count rate; 0.5-2keV (ML_FLUX_s)mW.m**-2phot.flux;em.X-raydoubleE_MLFluxb4[0.0/0.01] 1 sigma upper error of flux; 2-4.5keV (ML_FLUX_UPERR_b4)mW.m**-2stat.error;stat.maxdoubleE_MLFluxs[0.0/0.01] 1 sigma upper error of flux; 0.5-2keV (ML_FLUX_UPERR_s)mW.m**-2stat.error;stat.maxdoubleApCtshTotal counts extracted within the aperture; 2.3-5keV (APE_CTS_h)ctphot.count;em.X-rayintApCtsuTotal counts extracted within the aperture; 5-8keV (APE_CTS_u)ctphot.count;em.X-rayintApExpb1[31.31/3393.24] Vignetted exposure value; 0.2-0.5keV (APE_EXP_b1)sstat.value;obs.exposurefloatApExpb2[28.12/3353.79] Vignetted exposure value; 0.5-1keV (APE_EXP_b2)sstat.value;obs.exposurefloatApExpb3[29.29/3304.8] Vignetted exposure value; 1-2keV (APE_EXP_b3)sstat.value;obs.exposurefloatApExpb4[22.35/2952.79] Vignetted exposure value; 2-4.5keV (APE_EXP_b4)sstat.value;obs.exposurefloatApExps[26.97/3314.72] Vignetted exposure value; 0.5-2keV (APE_EXP_s)sstat.value;obs.exposurefloatApExph[20.81/2873.35] Vignetted exposure value; 2.3-5keV (APE_EXP_h)sstat.value;obs.exposurefloatApExpu[13.71/2497.99] Vignetted exposure value; 5-8keV (APE_EXP_u)sstat.value;obs.exposurefloatApBkgb3[0.0/2.47] Background counts in the aperture excluding nearby sources; 1-2keV (APE_BKG_b3)ctinstr.backgrounddoubleApBkgb4[0.0/5.97] Background counts in the aperture excluding nearby sources; 2-4.5keV (APE_BKG_b4)ctinstr.backgrounddoubleApBkgs[0.0/4.95] Background counts in the aperture excluding nearby sources; 0.5-2keV (APE_BKG_s)ctinstr.backgrounddoubleApBkgh[0.0/5.94] Background counts in the aperture excluding nearby sources; 2.3-5keV (APE_BKG_h)ctinstr.backgrounddoubleApBkgu[0.0/14.86] Background counts in the aperture excluding nearby sources; 5-8keV (APE_BKG_u)ctinstr.backgrounddoubleApRadb1[0.41/9.15] Aperture radius; 0.2-0.5keV (APE_RADIUS_b1)pixstat.fit.paramdoubleApRadb2[0.43/9.45] Aperture radius; 0.5-1keV (APE_RADIUS_b2)pixstat.fit.paramdoubleApRadb3[0.46/10.1] Aperture radius; 1-2keV (APE_RADIUS_b3)pixstat.fit.paramdoubleApRadb4[0.54/14.86] Aperture radius; 2-4.5keV (APE_RADIUS_b4)pixstat.fit.paramdoubleApRads[0.45/9.87] Aperture radius; 0.5-2keV (APE_RADIUS_s)pixstat.fit.paramdoubleApRadh[0.56/15.48] Aperture radius; 2.3-5keV (APE_RADIUS_h)pixstat.fit.paramdoubleApRadu[0.71/27.23] Aperture radius; 5-8keV (APE_RADIUS_u)pixstat.fit.paramdoubleApPoisb1? [0/0.93] Poisson probability of being background fluctuation; 0.2-0.5keV (APE_POIS_b1)pixstat.fit.goodnessdoublenullableApPoisb2? [0/0.84] Poisson probability of being background fluctuation; 0.5-1keV (APE_POIS_b2)pixstat.fit.goodnessdoublenullableApPoisb3? [0/0.83] Poisson probability of being background fluctuation; 1-2keV (APE_POIS_b3)pixstat.fit.goodnessdoublenullableApPoisb4? [0/1.0] Poisson probability of being background fluctuation; 2-4.5keV (APE_POIS_b4)pixstat.fit.goodnessdoublenullableApPoiss? [0/0.94] Poisson probability of being background fluctuation; 0.5-2keV (APE_POIS_s)pixstat.fit.goodnessdoublenullableApPoish? [0/1.0] Poisson probability of being background fluctuation; 2.3-5keV (APE_POIS_h)pixstat.fit.goodnessdoublenullableApPoisu? [0/1.0] Poisson probability of being background fluctuation; 5-8keV (APE_POIS_u)pixstat.fit.goodnessdoublenullableJ/A+A/661/A1/hardeFEDS hard-band selected catalog, converted from eFEDS_c001_hard_V7.5.fits)DetLike0Detection likelihood measured by PSF-fitting (DET_LIKE_0)stat.likelihooddoubleMLRate0Source count rate (ML_RATE_0)ct/sphot.count;em.X-raydoublee_MLRate0? 1 sigma count rate error (ML_RATE_ERR_0)ct/sstat.errordoublenullables_MLRateb31 sigma count rate error; 1-2keV (ML_RATE_ERR_b3)ct/sarith.rate;phot.countdoubleMLCtsb2Source net counts measured from count rate; 0.5-1keV (ML_CTS_b2)ctphot.count;em.X-raydoubleMLCtsb3Source net counts measured from count rate; 1-2keV (ML_CTS_b3)ctphot.count;em.X-raydoubleMLCtsb4Source net counts measured from count rate; 2-4.5keV (ML_CTS_b4)ctphot.count;em.X-raydoubleMLCtssSource net counts measured from count rate; 0.5-2keV (ML_CTS_s)ctphot.count;em.X-raydoubleMLCtshSource net counts measured from count rate; 2.3-5keV (ML_CTS_h)ctphot.count;em.X-raydoubleMLCtsuSource net counts measured from count rate; 5-8keV (ML_CTS_u)ctphot.count;em.X-raydoubles_MLCtsb11 sigma counts error; 0.2-0.5keV (ML_CTS_ERR_b1)ctstat.error;phot.countdoubles_MLCtsb21 sigma counts error; 0.5-1keV (ML_CTS_ERR_b2)ctstat.error;phot.countdoubles_MLCtsb31 sigma counts error; 1-2keV (ML_CTS_ERR_b3)ctstat.error;phot.countdoubles_MLCtsb41 sigma counts error; 2-4.5keV (ML_CTS_ERR_b4)ctstat.error;phot.countdoubles_MLCtss1 sigma counts error; 0.5-2keV (ML_CTS_ERR_s)ctstat.error;phot.countdoubles_MLCtsh1 sigma counts error; 2.3-5keV (ML_CTS_ERR_h)ctstat.error;phot.countdoubles_MLCtsu1 sigma counts error; 5-8keV (ML_CTS_ERR_u)ctstat.error;phot.countdoublee_MLCtsb11 sigma lower error of counts; 0.2-0.5keV (ML_CTS_LOWERR_b1)ctstat.errordoublee_MLCtsb21 sigma lower error of counts; 0.5-1keV (ML_CTS_LOWERR_b2)ctstat.errordoublee_MLCtsb31 sigma lower error of counts; 1-2keV (ML_CTS_LOWERR_b3)ctstat.errordoublee_MLCtsb41 sigma lower error of counts; 2-4.5keV (ML_CTS_LOWERR_b4)ctstat.errordoublee_MLCtss1 sigma lower error of counts; 0.5-2keV (ML_CTS_LOWERR_s)ctstat.errordoublee_MLCtsh1 sigma lower error of counts; 2.3-5keV (ML_CTS_LOWERR_h)ctstat.errordoubleE_MLCtss1 sigma upper error of counts; 0.5-2keV (ML_CTS_UPERR_s)ctstat.error;stat.maxdoubleE_MLCtsh1 sigma upper error of counts; 2.3-5keV (ML_CTS_UPERR_h)ctstat.error;stat.maxdoubleE_MLCtsu1 sigma upper error of counts; 5-8keV (ML_CTS_UPERR_u)ctstat.error;stat.maxdoubleMLExpsVignetted exposure value; 0.5-2keV (ML_EXP_s)sstat.value;obs.exposurefloatMLExphVignetted exposure value; 2.3-5keV (ML_EXP_h)sstat.value;obs.exposurefloatMLExpuVignetted exposure value; 5-8keV (ML_EXP_u)sstat.value;obs.exposurefloatApExPb1Vignetted exposure value; 0.2-0.5keV (APE_EXP_b1)sstat.value;obs.exposurefloatApRadb4Aperture radius; 2-4.5keV (APE_RADIUS_b4)pixstat.fit.paramdoubleApRadsAperture radius; 0.5-2keV (APE_RADIUS_s)pixstat.fit.paramdoubleApRadhAperture radius; 2.3-5keV (APE_RADIUS_h)pixstat.fit.paramdoublerecnoRecord number assigned by the VizieR team. Should Not be used for identification.meta.recordintNameSource name, eFEDS JHHMMSS.s+DDMMSS (Name)meta.id;meta.maincharID-SRC[1/28075] Source ID for hard catalog (ID_SRC)meta.idintID-main? Source ID in the single-band detected, eFEDS main catalog (ID_main)meta.idintnullableRA_ICRS[127.17/145.14] Uncorrected RA (ICRS) (RA)degpos.eq.ra;meta.mainDE_ICRS[-2.49/5.63] Uncorrected Dec (ICRS) (DEC)degpos.eq.dec;meta.mainePos? Combined positional uncertainty, uncorrected (RADEC_ERR)arcsecstat.error;posdoublenullableRAcdegCorrected RA (ICRS) (RA_CORR)degpos.eq.raDEcdegCorrected Dec (ICRS) (DEC_CORR)degpos.eq.decePosCCombined positional uncertainty, corrected (RADEC_ERR_CORR)arcsecstat.error;posdoubleExtSource extent (EXT)arcsecphys.angSizedoublee_ExtExtent error (EXT_ERR)arcsecstat.errordoubleExtLikeExtent likelihood (EXT_LIKE)stat.likelihooddoubleMLCts0Source net counts, combining 3 bands (ML_CTS_0)ctphot.count;em.X-raydoublee_MLCts0? 1 sigma counts error (ML_CTS_ERR_0)ctstat.errordoublenullableMLFlux0Source flux (ML_FLUX_0)mW.m**-2phot.flux;em.X-raydoublee_MLFlux0? 1 sigma flux error (ML_FLUX_ERR_0)mW.m**-2stat.errordoublenullableMLBkg0Background flux at the source position (ML_BKG_0)count.arcmin**-2instr.backgrounddoubleinArea90True if in the 0.2-2.3keV exp>500s region, which comprises 90% area (inArea90)meta.codeintDetLike1Detection likelihood measured by PSF-fitting (DET_LIKE_1)stat.likelihooddoubleDetLike2Detection likelihood measured by PSF-fitting (DET_LIKE_2)stat.likelihooddoubleDetLike3Detection likelihood measured by PSF-fitting (DET_LIKE_3)stat.likelihooddoubleMLRate1Source count rate measured by PSF-fitting (ML_RATE_1)ct/sphot.count;em.X-raydoubleMLRate2Source count rate measured by PSF-fitting (ML_RATE_2)ct/sphot.count;em.X-raydoubleMLRate3Source count rate measured by PSF-fitting (ML_RATE_3)ct/sphot.count;em.X-raydoubles_MLRate1? 1 sigma count rate error (ML_RATE_ERR_1)ct/sarith.rate;phot.countdoublenullables_MLRate2? 1 sigma count rate error (ML_RATE_ERR_2)ct/sarith.rate;phot.countdoublenullables_MLRate3? 1 sigma count rate error (ML_RATE_ERR_3)ct/sarith.rate;phot.countdoublenullableMLCts1Source net counts measured from count rate (ML_CTS_1)ctphot.count;em.X-raydoubleMLCts2Source net counts measured from count rate (ML_CTS_2)ctphot.count;em.X-raydoubleMLCts3Source net counts measured from count rate (ML_CTS_3)ctphot.count;em.X-raydoubles_MLCts1? 1 sigma counts error (ML_CTS_ERR_1)ctstat.error;phot.countdoublenullables_MLCts2? 1 sigma counts error (ML_CTS_ERR_2)ctstat.error;phot.countdoublenullables_MLCts3? 1 sigma counts error (ML_CTS_ERR_3)ctstat.error;phot.countdoublenullableMLFlux1Source flux converted from count rate (ML_FLUX_1)mW.m**-2phot.flux;em.X-raydoubleMLFlux2Source flux converted from count rate (ML_FLUX_2)mW.m**-2phot.flux;em.X-raydoubleMLFlux3Source flux converted from count rate (ML_FLUX_3)mW.m**-2phot.flux;em.X-raydoubles_MLFlux1? 1 sigma flux error (ML_FLUX_ERR_1)mW.m**-2stat.error;phot.fluxdoublenullables_MLFlux2? 1 sigma flux error (ML_FLUX_ERR_2)mW.m**-2stat.error;phot.fluxdoublenullables_MLFlux3? 1 sigma flux error (ML_FLUX_ERR_3)mW.m**-2stat.error;phot.fluxdoublenullableMLExp1Vignetted exposure value (ML_EXP_1)sstat.value;obs.exposuredoubleMLExp2Vignetted exposure value (ML_EXP_2)sstat.value;obs.exposuredoubleMLExp3Vignetted exposure value (ML_EXP_3)sstat.value;obs.exposuredoubleMLBkg1Background flux at the source position (ML_BKG_1)count.arcmin**-2instr.backgrounddoubleMLBkg2Background flux at the source position (ML_BKG_2)count.arcmin**-2instr.backgrounddoubleMLBkg3Background flux at the source position (ML_BKG_3)count.arcmin**-2instr.backgrounddoubleDetLikeb1Detection likelihood measured by forced PSF-fitting; 0.2-0.5keV (DET_LIKE_b1)stat.likelihooddoubleDetLikeb2Detection likelihood measured by forced PSF-fitting; 0.5-1keV (DET_LIKE_b2)stat.likelihooddoubleDetLikeb3Detection likelihood measured by forced PSF-fitting; 1-2keV (DET_LIKE_b3)stat.likelihooddoubleDetLikeb4Detection likelihood measured by forced PSF-fitting; 2-4.5keV (DET_LIKE_b4)stat.likelihooddoubleDetLikesDetection likelihood measured by forced PSF-fitting; 0.5-2keV (DET_LIKE_s)stat.likelihooddoubleDetLikehDetection likelihood measured by forced PSF-fitting; 2.3-5keV (DET_LIKE_h)stat.likelihooddoubleDetLikeuDetection likelihood measured by forced PSF-fitting; 5-8keV (DET_LIKE_u)stat.likelihooddoubleMLRateb1Source count rate measured by forced PSF-fitting;.2-.5keV (ML_RATE_b1)ct/sphot.count;em.X-raydoubleMLRateb2Source count rate measured by forced PSF-fitting;0.5-1keV (ML_RATE_b2)ct/sphot.count;em.X-raydoubleMLRateb3Source count rate measured by forced PSF-fitting; 1-2keV (ML_RATE_b3)ct/sphot.count;em.X-raydoubleMLRateb4Source count rate measured by forced PSF- fitting;2-4.5keV (ML_RATE_b4)ct/sphot.count;em.X-raydoubleMLRatesSource count rate measured by forced PSF-fitting;0.5-2keV (ML_RATE_s)ct/sphot.count;em.X-raydoubleMLRatehSource count rate measured by forced PSF- fitting;2.3-5keV (ML_RATE_h)ct/sphot.count;em.X-raydoubleMLRateuSource count rate measured by forced PSF-fitting; 5-8keV (ML_RATE_u)ct/sphot.count;em.X-raydoubles_MLRateb11 sigma count rate error; 0.2-0.5keV (ML_RATE_ERR_b1)ct/sarith.rate;phot.countdoubles_MLRateb21 sigma count rate error; 0.5-1keV (ML_RATE_ERR_b2)ct/sarith.rate;phot.countdoubles_MLRateb41 sigma count rate error; 2-4.5keV (ML_RATE_ERR_b4)ct/sarith.rate;phot.countdoubles_MLRates1 sigma count rate error; 0.5-2keV (ML_RATE_ERR_s)ct/sarith.rate;phot.countdoubles_MLRateh1 sigma count rate error; 2.3-5keV (ML_RATE_ERR_h)ct/sarith.rate;phot.countdoubles_MLRateu1 sigma count rate error; 5-8keV (ML_RATE_ERR_u)ct/sarith.rate;phot.countdoublee_MLRateb11 sigma lower error of count rate; 0.2-0.5keV (ML_RATE_LOWERR_b1)ct/sstat.errordoublee_MLRateb21 sigma lower error of count rate; 0.5-1keV (ML_RATE_LOWERR_b2)ct/sstat.errordoublee_MLRateb31 sigma lower error of count rate; 1-2keV (ML_RATE_LOWERR_b3)ct/sstat.errordoublee_MLRateb41 sigma lower error of count rate; 2-4.5keV (ML_RATE_LOWERR_b4)ct/sstat.errordoublee_MLRates1 sigma lower error of count rate; 0.5-2keV (ML_RATE_LOWERR_s)ct/sstat.errordoublee_MLRateh1 sigma lower error of count rate; 2.3-5keV (ML_RATE_LOWERR_h)ct/sstat.errordoublee_MLRateu1 sigma lower error of count rate; 5-8keV (ML_RATE_LOWERR_u)ct/sstat.errordoubleE_MLRateb11 sigma upper error of count rate; 0.2-0.5keV (ML_RATE_UPERR_b1)ct/sstat.error;stat.maxdoubleE_MLRateb21 sigma upper error of count rate; 0.5-1keV (ML_RATE_UPERR_b2)ct/sstat.error;stat.maxdoubleE_MLRateb31 sigma upper error of count rate; 1-2keV (ML_RATE_UPERR_b3)ct/sstat.error;stat.maxdoubleE_MLRateb41 sigma upper error of count rate; 2-4.5keV (ML_RATE_UPERR_b4)ct/sstat.error;stat.maxdoubleE_MLRates1 sigma upper error of count rate; 0.5-2keV (ML_RATE_UPERR_s)ct/sstat.error;stat.maxdoubleE_MLRateh1 sigma upper error of count rate; 2.3-5keV (ML_RATE_UPERR_h)ct/sstat.error;stat.maxdoubleE_MLRateu1 sigma upper error of count rate; 5-8keV (ML_RATE_UPERR_u)ct/sstat.error;stat.maxdoubleMLCtsb1Source net counts measured from count rate; 0.2-0.5keV (ML_CTS_b1)ctphot.count;em.X-raydoublee_MLCtsu1 sigma lower error of counts; 5-8keV (ML_CTS_LOWERR_u)ctstat.errordoubleE_MLCtsb11 sigma upper error of counts; 0.2-0.5keV (ML_CTS_UPERR_b1)ctstat.error;stat.maxdoubleE_MLCtsb21 sigma upper error of counts; 0.5-1keV (ML_CTS_UPERR_b2)ctstat.error;stat.maxdoubleE_MLCtsb31 sigma upper error of counts; 1-2keV (ML_CTS_UPERR_b3)ctstat.error;stat.maxdoubleE_MLCtsb41 sigma upper error of counts; 2-4.5keV (ML_CTS_UPERR_b4)ctstat.error;stat.maxdoubleMLFluxb1Source flux converted from count rate; 0.2-0.5keV (ML_FLUX_b1)mW.m**-2phot.flux;em.X-raydoubleMLFluxb2Source flux converted from count rate; 0.5-1keV (ML_FLUX_b2)mW.m**-2phot.flux;em.X-raydoubleMLFluxb3Source flux converted from count rate; 1-2keV (ML_FLUX_b3)mW.m**-2phot.flux;em.X-raydoubleMLFluxb4Source flux converted from count rate; 2-4.5keV (ML_FLUX_b4)mW.m**-2phot.flux;em.X-raydoubleMLFluxsSource flux converted from count rate; 0.5-2keV (ML_FLUX_s)mW.m**-2phot.flux;em.X-raydoubleMLFluxhSource flux converted from count rate; 2.3-5keV (ML_FLUX_h)mW.m**-2phot.flux;em.X-raydoubleMLFluxuSource flux converted from count rate; 5-8keV (ML_FLUX_u)mW.m**-2phot.flux;em.X-raydoubles_MLFluxb11 sigma flux error; 0.2-0.5keV (ML_FLUX_ERR_b1)mW.m**-2stat.error;phot.fluxdoubles_MLFluxb21 sigma flux error; 0.5-1keV (ML_FLUX_ERR_b2)mW.m**-2stat.error;phot.fluxdoubles_MLFluxb31 sigma flux error; 1-2keV (ML_FLUX_ERR_b3)mW.m**-2stat.error;phot.fluxdoubles_MLFluxb41 sigma flux error; 2-4.5keV (ML_FLUX_ERR_b4)mW.m**-2stat.error;phot.fluxdoubles_MLFluxs1 sigma flux error; 0.5-2keV (ML_FLUX_ERR_s)mW.m**-2stat.error;phot.fluxdoubles_MLFluxh1 sigma flux error; 2.3-5keV (ML_FLUX_ERR_h)mW.m**-2stat.error;phot.fluxdoubles_MLFluxu1 sigma flux error; 5-8keV (ML_FLUX_ERR_u)mW.m**-2stat.error;phot.fluxdoublee_MLFluxb11 sigma lower error of flux; 0.2-0.5keV (ML_FLUX_LOWERR_b1)mW.m**-2stat.errordoublee_MLFluxb21 sigma lower error of flux; 0.5-1keV (ML_FLUX_LOWERR_b2)mW.m**-2stat.errordoublee_MLFluxb31 sigma lower error of flux; 1-2keV (ML_FLUX_LOWERR_b3)mW.m**-2stat.errordoublee_MLFluxb41 sigma lower error of flux; 2-4.5keV (ML_FLUX_LOWERR_b4)mW.m**-2stat.errordoublee_MLFluxs1 sigma lower error of flux; 0.5-2keV (ML_FLUX_LOWERR_s)mW.m**-2stat.errordoublee_MLFluxh1 sigma lower error of flux; 2.3-5keV (ML_FLUX_LOWERR_h)mW.m**-2stat.errordoublee_MLFluxu1 sigma lower error of flux; 5-8keV (ML_FLUX_LOWERR_u)mW.m**-2stat.errordoubleE_MLFluxb11 sigma upper error of flux; 0.2-0.5keV (ML_FLUX_UPERR_b1)mW.m**-2stat.error;stat.maxdoubleE_MLFluxb21 sigma upper error of flux; 0.5-1keV (ML_FLUX_UPERR_b2)mW.m**-2stat.error;stat.maxdoubleE_MLFluxb31 sigma upper error of flux; 1-2keV (ML_FLUX_UPERR_b3)mW.m**-2stat.error;stat.maxdoubleE_MLFluxb41 sigma upper error of flux; 2-4.5keV (ML_FLUX_UPERR_b4)mW.m**-2stat.error;stat.maxdoubleE_MLFluxs1 sigma upper error of flux; 0.5-2keV (ML_FLUX_UPERR_s)mW.m**-2stat.error;stat.maxdoubleE_MLFluxh1 sigma upper error of flux; 2.3-5keV (ML_FLUX_UPERR_h)mW.m**-2stat.error;stat.maxdoubleE_MLFluxu1 sigma upper error of flux; 5-8keV (ML_FLUX_UPERR_u)mW.m**-2stat.error;stat.maxdoubleMLExpb1Vignetted exposure value; 0.2-0.5keV (ML_EXP_b1)sstat.value;obs.exposurefloatMLExpb2Vignetted exposure value; 0.5-1keV (ML_EXP_b2)sstat.value;obs.exposurefloatMLExpb3Vignetted exposure value; 1-2keV (ML_EXP_b3)sstat.value;obs.exposurefloatMLExpb4Vignetted exposure value; 2-4.5keV (ML_EXP_b4)sstat.value;obs.exposurefloatMLBkgb1Background flux at the source position; 0.2-0.5keV (ML_BKG_b1)count.arcmin**-2instr.backgrounddoubleMLBkgb2Background flux at the source position; 0.5-1keV (ML_BKG_b2)count.arcmin**-2instr.backgrounddoubleMLBkgb3Background flux at the source position; 1-2keV (ML_BKG_b3)count.arcmin**-2instr.backgrounddoubleMLBkgb4Background flux at the source position; 2-4.5keV (ML_BKG_b4)count.arcmin**-2instr.backgrounddoubleMLBkgsBackground flux at the source position; 0.5-2keV (ML_BKG_s)count.arcmin**-2instr.backgrounddoubleMLBkghBackground flux at the source position; 2.3-5keV (ML_BKG_h)count.arcmin**-2instr.backgrounddoubleMLBkguBackground flux at the source position; 5-8keV (ML_BKG_u)count.arcmin**-2instr.backgrounddoubleApCtsb1Total counts extracted in the aperture; 0.2-0.5keV (APE_CTS_b1)ctphot.count;em.X-rayintApCtsb2Total counts extracted in the aperture; 0.5-1keV (APE_CTS_b2)ctphot.count;em.X-rayintApCtsb3Total counts extracted in the aperture; 1-2keV (APE_CTS_b3)ctphot.count;em.X-rayintApCtsb4Total counts extracted in the aperture; 2-4.5keV (APE_CTS_b4)ctphot.count;em.X-rayintApCtssTotal counts extracted in the aperture; 0.5-2keV (APE_CTS_s)ctphot.count;em.X-rayintApCtshTotal counts extracted in the aperture; 2.3-5keV (APE_CTS_h)ctphot.count;em.X-rayintApCtsuTotal counts extracted in the aperture; 5-8keV (APE_CTS_u)ctphot.count;em.X-rayintApExPb2Vignetted exposure value; 0.5-1keV (APE_EXP_b2)sstat.value;obs.exposurefloatApExPb3Vignetted exposure value; 1-2keV (APE_EXP_b3)sstat.value;obs.exposurefloatApExPb4Vignetted exposure value; 2-4.5keV (APE_EXP_b4)sstat.value;obs.exposurefloatApExPsVignetted exposure value; 0.5-2keV (APE_EXP_s)sstat.value;obs.exposurefloatApExPhVignetted exposure value; 2.3-5keV (APE_EXP_h)sstat.value;obs.exposurefloatApExPuVignetted exposure value; 5-8keV (APE_EXP_u)sstat.value;obs.exposurefloatApBkgb1Background counts in the aperture, excluding nearby sources; 0.2-0.5keV (APE_BKG_b1)ctinstr.backgrounddoubleApBkgb2Background counts in the aperture, excluding nearby sources; 0.5-1keV (APE_BKG_b2)ctinstr.backgrounddoubleApBkgb3Background counts in the aperture, excluding nearby sources; 1-2keV (APE_BKG_b3)ctinstr.backgrounddoubleApBkgb4Background counts in the aperture, excluding nearby sources; 2-4.5keV (APE_BKG_b4)ctinstr.backgrounddoubleApBkgsBackground counts in the aperture, excluding nearby sources; 0.5-2keV (APE_BKG_s)ctinstr.backgrounddoubleApBkghBackground counts in the aperture, excluding nearby sources; 2.3-5keV (APE_BKG_h)ctinstr.backgrounddoubleApBkguBackground counts in the aperture, excluding nearby sources; 5-8keV (APE_BKG_u)ctinstr.backgrounddoubleApRadb1Aperture radius; 0.2-0.5keV (APE_RADIUS_b1)pixstat.fit.paramdoubleApRadb2Aperture radius; 0.5-1keV (APE_RADIUS_b2)pixstat.fit.paramdoubleApRadb3Aperture radius; 1-2keV (APE_RADIUS_b3)pixstat.fit.paramdoubleApRaduAperture radius; 5-8keV (APE_RADIUS_u)pixstat.fit.paramdoubleApPoisb1? Poisson probability of being background fluctuation; 0.2-0.5keV (APE_POIS_b1)stat.fit.goodnessdoublenullableApPoisb2? Poisson probability of being background fluctuation; 0.5-1keV (APE_POIS_b2)stat.fit.goodnessdoublenullableApPoisb3? Poisson probability of being background fluctuation; 1-2keV (APE_POIS_b3)stat.fit.goodnessdoublenullableApPoisb4? Poisson probability of being background fluctuation; 2-4.5keV (APE_POIS_b4)stat.fit.goodnessdoublenullableApPoiss? Poisson probability of being background fluctuation; 0.5-2keV (APE_POIS_s)stat.fit.goodnessdoublenullableApPoish? Poisson probability of being background fluctuation; 2.3-5keV (APE_POIS_h)stat.fit.goodnessdoublenullableApPoisu? Poisson probability of being background fluctuation; 5-8keV (APE_POIS_u)stat.fit.goodnessdoublenullable